Work

Research on PCB Defect Detection Based on YOLOv8n-DDS

Year: 2025

Type: conference-paper

DOI: 10.1109/iscait64916.2025.11010728

Author: Yuan Yang

Institution: China West Normal University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: China West Normal University

OpenAlex ID: W4410986980

FWCI:

Cites: 1

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Related to: 10