Work

Analysis and Improvement of High Temperature LU Problem in CMOS RF Chip

Year: 2025

Type: conference-paper

DOI: 10.1109/cstic64481.2025.11018007

Authors: Yanwei Tian, Xiao He, Shuanshe Chao, Haopeng Zou, Shaoqi Guo, Dan Yang, Na Mei

Language: English

Topic: Electrostatic Discharge in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4410987154

FWCI:

Cites: 4

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Related to: 10