Work

Optimization of a Novel Integrated Zener Diode with Polysilicon Structure for Gate Protection in 55 nm BCD Technology

Year: 2025

Type: conference-paper

DOI: 10.1109/cstic64481.2025.11017896

Authors: Yanning Chen, Pingrui Kang, Fang Liu, Bo Wu, Yongfeng Deng, Xiaoyun Huang, Yixian Song, Yongyu Wu, Dawei Gao, Kai Xu

Institution: Zhejiang University

Language: English

Topic: Electrostatic Discharge in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4410987315

FWCI:

Cites: 12

Cited by:

Related to: 10