Work

Impact of X-ray Irradiation on Transfer Characteristics of Fin-FeFET Devices

Year: 2025

Type: conference-paper

DOI: 10.1109/cstic64481.2025.11017915

Authors: Jiahao Yao, Ziming Xu, Siyuan Liu, Gaobo Xu

Institutions: Chinese Academy of Sciences, Institute of Microelectronics

Language: English

Topic: Ferroelectric and Negative Capacitance Devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Research and Development

OpenAlex ID: W4410987334

FWCI:

Cites: 6

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Related to: 10