Work

Uncertainty Quantification on Multiscale Modeling of RRAM Devices

Year: 2025

Type: conference-paper

DOI: 10.1109/cstic64481.2025.11017780

Authors: Ziyan Liao, Zhiheng Huang, Min Xiao, Yuezhong Meng, Hui Yan, Yang Liu

Institution: Sun Yat-sen University

Language: English

Topic: Advanced Memory and Neural Computing

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

OpenAlex ID: W4410987355

FWCI:

Cites: 8

Cited by:

Related to: 10