Work

Study of Breakdown Voltage Optimization in 1100V HVIC NLDMOS Devices

Year: 2025

Type: conference-paper

DOI: 10.1109/cstic64481.2025.11017919

Authors: Jian Ma, Shangze Wu, Jun Hu, Haiyang Ling, Wenting Duan, Wensheng Qian, Chunlei Wu

Institution: Fudan University

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4410987478

FWCI:

Cites: 4

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Related to: 10