Year: 2025
Type: book-chapter
Abstract: Secondary ion mass spectrometry (SIMS) is at an exciting juncture of technological advances in mass spectrometer designs and new ion beams that have rapidly accelerated its capabilities for advanced measurements in science and technology. Innovation in ion beams is enabling the desorption and ionization of biomolecules that previously could not be detected. Recent advances in novel high-resolution mass spectrometers provide the ability to identify these ions with higher sensitivity and higher confidence in identification than ever before. This chapter presents the concept and applications of recent high-performance and MS/MS analysers in SIMS.
Language: English
Subfield: Computational Mechanics
Field: Engineering
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W4411098762