Impact of High- k Bandgap Engineering on V-NAND Cell Performance
Year: 2025
Type: article
Source: IEEE Electron Device Letters
Authors: Myeongsang Yun, Gyuhyeon Lee, Gunwook Yoon, Seungjae Baik, Myounggon Kang
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Funder: Samsung
OpenAlex ID: W4411142928