Work

Temperature Dependence of Single-Event Burnout Across Varying LET Levels

Year: 2025

Type: article

Source: IEEE Transactions on Device and Materials Reliability

DOI: 10.1109/tdmr.2025.3578041

Authors: Fengkai Liu, Zhijie Zhou, Yadong Wei, Xiaodong Xu, Zhongli Liu, Jianqun Yang, Xingji Li

Institution: Harbin Institute of Technology

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411143092

FWCI: 0.693

Cites: 45

Cited by: 3

Related to: 10