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A KL Divergence-Based Test Strip Classification Algorithm with Attention-Contrastive Learning Network

Year: 2025

Type: conference-paper

Source: International Conference on Advanced Algorithms and Control Engineering (ICAACE)

DOI: 10.1109/icaace65325.2025.11019106

Authors: Xiaofan Xia, Genke Yang

Institution: Shanghai Jiao Tong University

Language: English

Topic: Advanced Neural Network Applications

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411143383

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Cites: 7

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Related to: 10