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The Research Focuses on Enhancing the RTDETR Model for Improved Detection of PCB Defects

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Year: 2025
Type: conference-paper
Source: International Conference on Advanced Algorithms and Control Engineering (ICAACE)
DOI: 10.1109/icaace65325.2025.11019618
Authors: Gang Wang, Yaohui Pan, Yu Jun
Institutions: Jilin Communications Polytechnic, Jilin University of Chemical Technology
Language: English

Topic: Industrial Vision Systems and Defect Detection
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences

Open Access status: closed

Funders: Natural Science Foundation of Jilin Province, Education Department of Jilin Province
Awards: G5183616297, G7707356165
OpenAlex ID: W4411143785
FWCI: 5.052
Cites: 8
Cited by: 2
Related to: 10
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