The Research Focuses on Enhancing the RTDETR Model for Improved Detection of PCB Defects
Year: 2025
Type: conference-paper
Authors: Gang Wang, Yaohui Pan, Yu Jun
Language: English
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Awards: G5183616297, G7707356165
OpenAlex ID: W4411143785
