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Deep Learning-Based Defect Detection in Printed Circuit Boards Using Machine Vision

Year: 2025

Type: conference-paper

DOI: 10.1109/iccct63501.2025.11019314

Authors: Shivakumar Udkar, Vikas Gupta

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4411173724

FWCI:

Cites: 13

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Related to: 10