Work

Damage Detection in a Complex Truss Structure via EIT With Mixed Regularization

Year: 2025

Type: conference-paper

Source: ASME Aerospace Structures, Structural Dynamics, and Materials Conference (SSDM)

DOI: 10.1115/ssdm2025-151372

Authors: Tyler N. Tallman, Laura Homa, Mark Flores, John Wertz

Institutions: Purdue University West Lafayette, University of Dayton Research Institute, Engineering and Software System Solutions (United States), United States Air Force Research Laboratory

Language: English

Topic: Electrical and Bioimpedance Tomography

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411199829

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