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Interactive Incremental Defect Detection Framework With Macroprobability-Controlled Adaptive Learning

Year: 2025

Type: article

Source: IEEE Transactions on Industrial Informatics

DOI: 10.1109/tii.2025.3568499

Authors: Jun Yang, Bin Gao, Yifei Gong, Yukuan Kang, Wai Lok Woo

Institutions: University of Electronic Science and Technology of China, Northumbria University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Key Research and Development Program of China

OpenAlex ID: W4411202932

FWCI: 13.17

Cites: 32

Cited by: 26

Related to: 10