A New Methodology for Calculating the Statistical Distribution of Power Supply Noise in Chip-Package-PCB Co-Design
Year: 2025
Type: article
Authors: Yuhuan Luo, Xiuqin Chu, Haiyue Yuan, Tao Wei, Yuhao Huang, Jun Wang, Feng Wu, Yushan Li
Institution: Xidian University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4411203568
