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A New Methodology for Calculating the Statistical Distribution of Power Supply Noise in Chip-Package-PCB Co-Design

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Year: 2025
Type: article
Source: IEEE Transactions on Instrumentation and Measurement
DOI: 10.1109/tim.2025.3578714
Authors: Yuhuan Luo, Xiuqin Chu, Haiyue Yuan, Tao Wei, Yuhao Huang, Jun Wang, Feng Wu, Yushan Li
Institution: Xidian University
Language: English

Topic: Electromagnetic Compatibility and Noise Suppression
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, Key Research and Development Program of Ningxia, Fundamental Research Funds for the Central Universities, Key Research and Development Projects of Shaanxi Province
Awards: G1106345602, G1661710729, G2332027, G4614593100, G4626241765
OpenAlex ID: W4411203568
FWCI: 0.69
Cites: 27
Cited by: 3
Related to: 10
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