Single Event Upset Characterization of the Polarfire® SoC RISC-V Microprocessor SubSystem Using Proton Irradiation
Year: 2024
Type: conference-paper
Source: RADECS Data Workshop
Authors: David M. Hiemstra, Nelson Hu
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4411204345