Work

A Systematic Framework for Resistor Tolerance Analysis to Improve Voltage Stability in Electronic Circuits

Year: 2025

Type: conference-paper

Source: IEEE Open Conference of Electrical, Electronic and Information Sciences (eStream)

DOI: 10.1109/estream66938.2025.11016900

Authors: G. Sai Praneetha, V. Lakshmi Lahari, V. Madhusruthi, B. Archana, K. Madhavi Sriya, Y. V. Pavan Kumar, G. Pradeep Reddy

Institutions: VIT-AP University, Manipal Academy of Higher Education

Language: English

Topic: Engineering and Technology Innovations

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4411206265

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