Work

Radiation Induced Single Events and Cumulated Dose Effects on CMOS and InGaAs Image Sensors

Year: 2024

Type: conference-paper

Source: RADECS Data Workshop

DOI: 10.1109/radecs61975.2024.11017533

Authors: J-M. Belloir, V. Lalucaa, C. Virmontois, A. Materne, C. Durnez, V. Bernard, A. Antonsanti, J. Krynski, A. Le Roch, V. Goiffon

Institutions: Centre National d'Études Spatiales, Institut Supérieur de l'Aéronautique et de l'Espace (ISAE-SUPAERO), ISAE-SUPAERO Recherche

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411206498

FWCI: 0.806

Cites:

Cited by: 1

Related to: 10