Work

Predicting Equipment Failures in IoT Enabled Industrial Setups Using Deep Learning

Year: 2025

Type: conference-paper

Source: International Conference on Smart Systems for Applications in Electrical Sciences (ICSSES)

DOI: 10.1109/icsses64899.2025.11009359

Authors: Madhav Sharma, Ritam Dutta, Payal Bansal, Samiksha Agarwal, Hukum Chand Saini

Institutions: Poornima Institute of Engineering and Technology, Jagannath University, Jagannath University Jaipur

Language: English

Topic: Machine Fault Diagnosis Techniques

Subfield: Control and Systems Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4411206639

FWCI: 4.835

Cites:

Cited by: 2

Related to: 10