Open-Circuit Fault Detection in T-Type MLI Using XGBoost: A Machine Learning-Based Approach
Year: 2025
Type: conference-paper
Authors: Murat Karakılıç, Hasan Hataş, İshak Pacal
Institution: Van Yüzüncü Yıl Üniversitesi
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4411207644
