Data Pattern Dependence of the Total Ionizing Dose Effect in 3D Nand Flash Memories
Year: 2024
Type: conference-paper
Source: RADECS Data Workshop
Authors: Taiki Ozawa, Kazutoshi Kobayashi, Jun Furuta
Institutions: Kyoto Institute of Technology, Okayama Prefectural University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4411207683