Work

Compendium of Total Ionizing Dose Tests of Commercial-off-the-Shelf Components (Part 1)

Year: 2024

Type: conference-paper

Source: RADECS Data Workshop

DOI: 10.1109/radecs61975.2024.11017559

Authors: Michael Steffens, Jochen Kuhnhenn, Tobias Kündgen, Eike Paschkowski, Felix Siebert, Dorothea Wölk, Adrian Zentgraf, Gianluca Furano, Marc Poizat, Maris Tali

Institutions: Fraunhofer Institute for Technological Trend Analysis, European Space Research and Technology Centre

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411207701

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