Work

Single Event Effects (SEE), Laser, and Total Dose (TID) Testing for AFP1422 Flexible PWM Controller

Year: 2024

Type: conference-paper

Source: RADECS Data Workshop

DOI: 10.1109/radecs61975.2024.11017563

Authors: C. Yots, J. Cortman, K. Schulmeyer, A. Ghoshal, T. Farris

Institution: Apogee Semiconductor (United States)

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411207769

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