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PCB Defect Detection Using Machine Learning: YOLOv5 and Inception v3 CNN-Based Approach

Year: 2025

Type: conference-paper

Source: International Conference on Smart Systems for Applications in Electrical Sciences (ICSSES)

DOI: 10.1109/icsses64899.2025.11009644

Authors: Tanu Kumari, Theertha Raj, Pasuluru Sanath Darahas, N. Neelima, Bhavana. V

Institution: Amrita Vishwa Vidyapeetham

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4411207858

FWCI: 7.362

Cites:

Cited by: 3

Related to: 10