Work

Impact of Technology Node on Soft Error Sensitivity of Flip-Flops and Srams in St Bcd Technology

Year: 2024

Type: conference-paper

Source: RADECS Data Workshop

DOI: 10.1109/radecs61975.2024.11017567

Authors: A. Benfante, D. Crippa, A.M. Veggetti, A. Jain, C. Cazzaniga, M. Bagatin, S. Gerardin

Institutions: STMicroelectronics (Italy), STMicroelectronics (India), Rutherford Appleton Laboratory, University of Padua

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411207906

FWCI:

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