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Anomalous Rapid Voltage Decay in Transient Electromagnetic Data Caused by IP Effect: A Synthetic Study

Year: 2025

Type: conference-paper

DOI: 10.3997/2214-4609.202572022

Authors: J. Lu, H. El-Kaliouby, K. Panagiotis, X. Wang

Institutions: Chengdu University of Technology, King Fahd University of Petroleum and Minerals

Language: English

Topic: Geophysical and Geoelectrical Methods

Subfield: Geophysics

Field: Earth and Planetary Sciences

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411221286

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