Work

Evaluating the impact of FSDOI physical design strategies on automotive-grade semiconductor chip reliability and performance

Year: 2025

Type: article

Source: Journal of Computational Methods in Sciences and Engineering

DOI: 10.1177/14727978251346041

Authors: Jianhua Zhang, Yun Wang, Chao Lu, Kaihua Zheng, Rongrong Li, Junhui Zhao, Renchuan Yin, Zezheng Xiao

Institution: Guangdong Greater Bay Area Institute of Integrated Circuit and System

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4411223988

FWCI: 0.231

Cites: 26

Cited by: 1

Related to: 10