Work

Enhancing 3D XPT/SOM Reliability: Strategies for Mitigating Spike Current and Improving Read Endurance

Year: 2025

Type: conference-paper

Source: IEEE International Memory Workshop (IMW)

DOI: 10.1109/imw61990.2025.11026942

Authors: C. L. Sung, D. Daudelin, W. C. Chien, R. C. Jordan, S. Cheng, L. Gignac, D. Bishop, C. W. Yeh, L. Buzi, C. W. Cheng, J. X. Zheng, E. K. Lai, A. Ray, A. Grun, H. Y. Cheng, C. H. Lin, T. W. Chang, T. Takken, R. L. Bruce, M. BrightSky, H. L. Lung

Institutions: Macronix International (Taiwan), IBM (United States), IBM Research - Thomas J. Watson Research Center

Language: English

Topic: Phase-change materials and chalcogenides

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411233111

FWCI:

Cites: 4

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Related to: 10