Work

Proposal of Block Erase and Verify Schemes for Ferroelectric NAND: Overcoming Critical Challenges from Threshold Voltage Polarity

Year: 2025

Type: conference-paper

Source: IEEE International Memory Workshop (IMW)

DOI: 10.1109/imw61990.2025.11026990

Authors: Song-Hyeon Kuk, Bong Ho Kim, Youngkeun Park, Hyeon-Seong Hwang, Jae-Hoon Han, Byung Jin Cho, Byung Chul Jang, Sang-Hyeon Kim

Institutions: Korea Advanced Institute of Science and Technology, Korea Institute of Science and Technology, Kyungpook National University

Language: English

Topic: Ferroelectric and Negative Capacitance Devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: Korea Institute of Science and Technology, National Research Foundation of Korea

OpenAlex ID: W4411233172

FWCI: 2.358

Cites: 13

Cited by: 1

Related to: 10