Work

First Demonstration of Threshold Voltage Modeling in Multi-Hole V-NAND Flash Architecture with Noncircular Channel Hole Profiles

Year: 2025

Type: conference-paper

Source: IEEE International Memory Workshop (IMW)

DOI: 10.1109/imw61990.2025.11026951

Authors: Chanyang Park, Min-Kyu Jeong, Taein Lee, Sejun Park, Jung Hoon Lee, Yujin Lee, Seungwan Hong, Sung Hoi Hur

Institutions: Samsung (South Korea), Samsung Electronics (South Korea)

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411233219

FWCI: 2.293

Cites: 12

Cited by: 1

Related to: 10