Work

Reliability and Accuracy of a Qualified Split-Gate Flash In-Memory Compute Technology

Year: 2025

Type: conference-paper

Source: IEEE International Memory Workshop (IMW)

DOI: 10.1109/imw61990.2025.11026988

Authors: Steven Lemke, Louisa Schneider, Zonglin Li, Nhan Do

Institution: Microchip Technology (United States)

Language: English

Topic: Advanced Memory and Neural Computing

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411233236

FWCI: 4.717

Cites: 7

Cited by: 2

Related to: 10