Work

Novel Ultrafast Non-Destructive Readout of FeRAM by Low-Voltage Transient Current

Year: 2025

Type: conference-paper

Source: IEEE International Memory Workshop (IMW)

DOI: 10.1109/imw61990.2025.11026930

Authors: Mor M. Dahan, Emanuel Ber, Florian Wunderwald, Gilad Zilberman, Guy Orlev, Yair Keller, Einav Raveh, Ruben Alcala, Thomas Mikolajick, Uwe Schroeder, Eilam Yalon

Institutions: Technion – Israel Institute of Technology, NaMLab (Germany), Technische Universität Dresden

Language: English

Topic: Ferroelectric and Negative Capacitance Devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411233442

FWCI: 2.358

Cites: 8

Cited by: 1

Related to: 10