Work

Probing the atomic arrangement of honeycomb layered oxides via optimum bright-field scanning transmission electron microscopy (OBF-STEM)

Year: 2025
Type: article
Abstract: Honeycomb-layered oxides are gaining considerable interest across diverse fields, including electrochemistry, materials science, and condensed matter physics. Transmission electron microscopy (TEM) has significantly advanced our atomistic understanding of these materials; however, certain honeycomb-layered oxides, particularly solid-state electrolytes, are highly beam-sensitive, making conventional TEM techniques challenging to apply. Here, we employ low-dose atomic resolution optimum bright-field (OBF) scanning TEM (STEM) to maximise the signal-to-noise ratio, enabling the probing of the arrangement of atoms in honeycomb-layered Na2Zn2TeO6. This successful application of OBF–STEM facilitates the characterisation of local atomic structures in electron-beam-sensitive honeycomb-layered materials, thereby pushing the frontier of such observation techniques towards effectively investigating emergent phenomena occurring upon topotactic ion exchange reaction with molten Ag salt.
Language: English
Open Access status: green
OpenAlex ID: W4411247956
FWCI: 0.356
Cites: 20
Cited by: 1
Related to: 10