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Deep Learning-Based Device Twin Model and Its Testing Applications

Year: 2025

Type: conference-paper

Source: World Conference on Computing and Communication Technologies (WCCCT)

DOI: 10.1109/wccct65447.2025.11027932

Authors: Jiayong Yu, Houjun Wang, Yindong Xiao, Zihang Gao, Zhaokun Hu, Rui Jing

Institution: University of Electronic Science and Technology of China

Language: English

Topic: Advanced Power Amplifier Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4411271463

FWCI:

Cites: 17

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Related to: 10