Work

Negative photoconductivity induced by carrier trapping in hyperdoped silicon

Year: 2025

Type: article

Source: Materials Science in Semiconductor Processing

DOI: 10.1016/j.mssp.2025.109785

Authors: Z.B. Cao, X. Deng, H.W. Yang, Y.J. Chen, C. Wen, M. Chen, X.Y. Li, Y. Wei, B. Tan, Y. Ren

Institutions: Southwest University of Science and Technology, China Electronics Technology Group Corporation, Geely University of China, State Key Laboratory of Environmental-friendly Energy Materials

Language: English

Topic: Silicon and Solar Cell Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: China Electronics Technology Group Corporation, Outstanding Youth Science and Technology Talents Program of Sichuan

Awards: G4625614200, G8169590221

OpenAlex ID: W4411315558

FWCI: 1.126

Cites: 44

Cited by: 5

Related to: 10