Work

Forecasting the Remaining Useful Life (RUL) of Metallized Film Capacitors Affected by the Self-Healing Phenomenon

Year: 2025

Type: article

Source: IEEE Transactions on Dielectrics and Electrical Insulation

DOI: 10.1109/tdei.2025.3579739

Authors: Claire Rochefort, Pascal Venet, Guy Clerc, Ali Sari, Radoslava Mitova, Miao-Xin Wang

Institutions: Lyon 1 Université, École Centrale de Lyon, Centre National de la Recherche Scientifique, Laboratoire Ampère, Institut National des Sciences Appliquées de Lyon, Schneider Electric (France)

Language: English

Topic: Reliability and Maintenance Optimization

Subfield: Safety, Risk, Reliability and Quality

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Schneider Electric

OpenAlex ID: W4411336547

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