Hybrid FeFET-ECRAM Device for Enhanced Memory Window and Retention via Ion-Ferroelectric Synergy
Year: 2025
Type: article
Source: IEEE Electron Device Letters
Institution: Pohang University of Science and Technology
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Award: G1456874378
OpenAlex ID: W4411336850
