Remaining Useful Life Prediction of SiC MOSFETs Using the Autoformer-RELM Model
Year: 2025
Type: article
Authors: Wei Luo, Yufan Liu, Yili Pan, Lin Bai
Institution: University of Shanghai for Science and Technology
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4411337054