Work

Amorphous Silicon Nitride Thin Film Withstanding Up to 1700 °C: Structure and Thermal Conductivity

Year: 2025

Type: article

Source: The Journal of Physical Chemistry Letters

DOI: 10.1021/acs.jpclett.5c01552

Authors: Naifu Shen, Xiaoming Wu, Longyi Li, Xin Liang

Institutions: Chinese Academy of Sciences, Beijing Institute of Nanoenergy and Nanosystems, University of Chinese Academy of Sciences, Beijing University of Chemical Technology

Language: English

Topic: Thermal properties of materials

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funders: Chinese Academy of Sciences, Tsinghua University, Fundamental Research Funds for the Central Universities

Awards: G1864942688, G2501134098

OpenAlex ID: W4411344443

FWCI: 1.043

Cites: 37

Cited by: 5

Related to: 10