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Intelligent Defect Detection and Classification in Manufacturing Execution Systems with IoT

Year: 2024

Type: conference-paper

DOI: 10.1109/icstsdg61998.2024.11026633

Authors: Chitra Sabapathy Ranganathan, Aarthy S.T, S. Prabha, C. Srinivasan, M. Rajmohan, Malarvizhi S

Institutions: SRM Institute of Science and Technology, Saveetha University, Hindustan Institute of Technology and Science

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4411358992

FWCI: 0.744

Cites: 20

Cited by: 1

Related to: 10