Work

Correlation Between Irradiation-Induced Trap and Lifetime Performance of Pulsed Capacitor After Gamma Irradiation

Year: 2025

Type: article

Source: IEEE Transactions on Plasma Science

DOI: 10.1109/tps.2025.3575921

Authors: Hua Li, Xiaohui Su, Yucheng Wang, Qin Zhang, Fuchang Lin

Institution: Huazhong University of Science and Technology

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4411359116

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Cites: 33

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Related to: 10