Work

A 28 nm Dual-Mode SRAM-CIM Macro With Local Computing Cell for CNNs and Grayscale Edge Detection

Year: 2025

Type: article

Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems

DOI: 10.1109/tvlsi.2025.3578319

Authors: Chunyu Peng, Xiaohang Chen, Mengya Gao, Jiating Guo, Lijun Guan, Chenghu Dai, Zhiting Lin, Xiulong Wu

Institution: Anhui University

Language: English

Topic: Advanced Memory and Neural Computing

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, Key Research and Development Program of Jiangxi Province

Awards: G2022141888, G3740114563, G8606767069

OpenAlex ID: W4411405318

FWCI: 1.813

Cites: 26

Cited by: 8

Related to: 10