Enhancing Program Speed and Diminishing Read After Write Delay by Metal Work Function Engineering
Year: 2025
Type: article
Source: IEEE Electron Device Letters
Authors: Seokjoong Shin, Giuk Kim, Hyojun Choi, Sanghyun Park, Kwangyou Seo, Kwangsoo Kim, Wanki Kim, Daewon Ha, Jinho Ahn, Sanghun Jeon
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4411408328
