Work

Decoupling Polarization and Charges by In-Situ Vmid Extraction for Insight Into Trapping Dynamics of FeMFET

Year: 2025

Type: article

Source: IEEE Electron Device Letters

DOI: 10.1109/led.2025.3580719

Authors: Wenpu Luo, Runteng Zhu, Hanyong Shao, Xiaojian Xu, Yuejia Zhou, Ru Huang, Kechao Tang

Institution: Peking University

Language: English

Topic: Ferroelectric and Negative Capacitance Devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, Higher Education Discipline Innovation Project

Awards: G2390305753, G2504776311, G5962490683, G7480401652

OpenAlex ID: W4411408404

FWCI: 0.231

Cites: 21

Cited by: 1

Related to: 10