Learning-Based Detection of Intraday False Data Injection Attacks on DER Dispatch Signals
Year: 2025
Type: article
Source: IEEE Transactions on Smart Grid
Authors: Yiqian Wu, Jip Kim, Siddharth Bhela, Gil Zussman, James Anderson
Institutions: Columbia University, Siemens (United States)
Language: English
Subfield: Control and Systems Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4411408486
