Work

Resonance Frequency Measurement Unit (RFMU) for the Dynamic Characterization of Nanomechanical Resonator

Year: 2025

Type: article

Source: IEEE Transactions on Instrumentation and Measurement

DOI: 10.1109/tim.2025.3580899

Authors: Durgesh Banswar, Jay Krishna Anand, Ankur Goswami

Institution: Indian Institute of Technology Delhi

Language: English

Topic: Advanced MEMS and NEMS Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Department of Science and Technology, Philippines

Award: G8448872031

OpenAlex ID: W4411408534

FWCI: 0.451

Cites: 36

Cited by: 2

Related to: 10