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Insulator Defect Detection Based on Improved YOLOv5

Year: 2025
Type: conference-paper
Authors: Yankang Zhao, Qibin Zhou, Xiaoyan Bian, Jiawei Shen
Language: English
Open Access status: closed
OpenAlex ID: W4411408889
FWCI:
Cites: 10
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Related to: 10