Work

Detection and Classification of Cracked Eggs

Year: 2025

Type: conference-paper

Source: International Conference on Distributed Computing and Electrical Circuits and Electronics (ICDCECE)

DOI: 10.1109/icdcece65353.2025.11036060

Authors: Kevin Gratian Dsouza, Mangala Shetty, Keerthan Kumar, Spoorthi Shetty, Bharath S Bhat

Institution: Nitte University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDGs: Industry, innovation and infrastructure, Zero hunger

Open Access status: closed

OpenAlex ID: W4411409499

FWCI:

Cites: 15

Cited by:

Related to: 10