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Deep Learning based DeepLab Version 3+ for Fault Detection in Printed Circuit Boards Manufacturing

Year: 2025

Type: conference-paper

Source: International Conference on Distributed Computing and Electrical Circuits and Electronics (ICDCECE)

DOI: 10.1109/icdcece65353.2025.11035476

Authors: Srimaan Yarram, Manjunath HN, S. Karthiga, Mohammed Fallah, R Maranan

Institutions: Nitte Meenakshi Institute of Technology, Islamic University of Najaf, Saveetha University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4411409660

FWCI: 2.526

Cites: 17

Cited by: 1

Related to: 10