Work

Cross-Dimensional Control of Topological Defects and Critical Size Effect in Lead-Free Thin Films

Year: 2025

Type: article

Source: The Journal of Physical Chemistry C

DOI: 10.1021/acs.jpcc.5c02540

Authors: Shuang-Jie Chen, Xiang-Wei Guo, Jing-Hui Wang, Tong-Tong Shi, Jia-Qi Liu, Chang-Ji Li, Yu-Jia Wang, Yin-Lian Zhu, Xiu-Liang Ma, Yun-Long Tang

Institutions: University of Science and Technology of China, Chinese Academy of Sciences, Institute of Metal Research, Shenyang National Laboratory for Materials Science, Hunan University of Science and Technology, Songshan Lake Materials Laboratory, Institute of Physics, Quantum Science Center of Guangdong-Hong Kong-Macao Greater Bay Area

Language: English

Topic: Multiferroics and related materials

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, Youth Innovation Promotion Association of the Chinese Academy of Sciences, Natural Science Foundation of Liaoning Province, Department of Science and Technology of Liaoning Province, Liaoning Revitalization Talents Program, Institute of Metal Research, Chinese Academy of Sciences, National Key Research and Development Program of China, Songshan Lake Materials Laboratory

Awards: G1519716137, G195162102, G2630948576, G4143299477, G4631246059, G5152556561, G5194429695, G5212422398, G8335911866, G8424504547

OpenAlex ID: W4411438642

FWCI:

Cites: 47

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Related to: 10